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all_macros [2009/09/25 05:13]
ianmadsen
all_macros [2009/09/25 05:20] (current)
ianmadsen
Line 537: Line 537:
 } }
  
-macro INEL_FLAT_PLATE_V1(alpha,​ alpha_val, sd, sd_val) 
- ' Version by Ian Madsen CSIRO Minerals 
-        ' Equations for correction of intensity and sample displacement for flat plate samples 
-        ' in fixed incident beam geometry e.g. when using the Inel CPS120 position sensitive detector 
- ' Intensity correction derived from Toraya et al. (1993) 
- ' Sample displacement model derived by Ian Madsen 
-        ' ​  alpha = angle between incident beam and sample surface 
-        ' ​  ​2Theta = (alpha + beta) 
-        ' ​     where beta  = angle between diffracted beam(s) and sample surface 
- ​ ' ​  sd = sample displacement (in same units as detector radius) 
-        ' ​  Rs = 250mm for the Inel CPS120 detector 
-{ 
-   local alpha alpha_val 
-   local sd sd_val 
- 
-   ​scale_pks = If(2 Th <= alpha Deg , 0, 2.0 / (1 + Sin (alpha Deg)/Sin (2 * Th - alpha Deg))); 
-   ​th2_offset = -(Rad sd Sin (2 Th)) / (Rs Sin (alpha Deg)); 
-} 
 </​code>​ </​code>​

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