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fixed_incident_beam [2010/10/19 00:18]
rowlesmr Added internal links
fixed_incident_beam [2010/10/19 00:19]
rowlesmr fixed line breaks
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 Scales the intensity for a thick sample in fixed incident beam geometry Scales the intensity for a thick sample in fixed incident beam geometry
-Must be used in conjunction with Fixed_Incident_Beam_Peak_Position_Correction if you want to model sample displacement. This macro doesn'​t take into account the effect of any diffracted beam optics. As it stands, it is directly applicable to large curved PSDs, eg the Inel CPS120. Any slits, crystals etc in the diffracted beam would limit the detected intensity. The original paper discusses this.+Must be used in conjunction with Fixed_Incident_Beam_Peak_Position_Correction if you want to model sample displacement. This macro doesn'​t take into account the effect of any diffracted beam optics. As it stands, it is directly applicable to large curved PSDs, eg the Inel CPS120. Any slits, crystals etc in the diffracted beam would limit the detected intensity. The original paper discusses this.\\ 
 Ref: Toraya, H., Huang, T. C. & Wu, Y. (1993). J. Appl. Cryst. 26, 774-777. Ref: Toraya, H., Huang, T. C. & Wu, Y. (1993). J. Appl. Cryst. 26, 774-777.
 <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Intensity_Correction (alpha, alpha_v) <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Intensity_Correction (alpha, alpha_v)
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-Models sample displacement as required for a flat plate in fixed incident beam geometry. Valid for both thick and thin samples+Models sample displacement as required for a flat plate in fixed incident beam geometry. Valid for both thick and thin samples.\\ 
 Ref: Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546. Ref: Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546.
 <code topas>​macro Fixed_Incident_Beam_Peak_Position_Correction (alpha, alpha_v, sd, sd_v) <code topas>​macro Fixed_Incident_Beam_Peak_Position_Correction (alpha, alpha_v, sd, sd_v)
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 ===== Fixed_Incident_Beam_Footprint_Correction_With_Mixing ===== ===== Fixed_Incident_Beam_Footprint_Correction_With_Mixing =====
  
-A macro that corrects the peak profile for a flat plate in fixed incident beam geometry, assuming a parallel incident beam and no diffracted optics. Theoretically,​ the mixing parameter should be "​1"​ for an incident beam intensity profile of a hat, but realistically,​ there will be some tapering of intensity at the edges, hence the gaussian... This should be used in conjunction with [[fixed_incident_beam#​Fixed_Incident_Beam_Thick_Sample_Correction]].+A macro that corrects the peak profile for a flat plate in fixed incident beam geometry, assuming a parallel incident beam and no diffracted optics. Theoretically,​ the mixing parameter should be "​1"​ for an incident beam intensity profile of a hat, but realistically,​ there will be some tapering of intensity at the edges, hence the gaussian... This should be used in conjunction with [[fixed_incident_beam#​Fixed_Incident_Beam_Thick_Sample_Correction]].\\ 
 Ref: Rowles, M. R. & Madsen, I. C. (2010). J. Appl. Cryst. 43, 632-634. Ref: Rowles, M. R. & Madsen, I. C. (2010). J. Appl. Cryst. 43, 632-634.
 <code topas>​macro Fixed_Incident_Beam_Footprint_Correction_With_Mixing { FIBFCWM } <code topas>​macro Fixed_Incident_Beam_Footprint_Correction_With_Mixing { FIBFCWM }
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 ===== Fixed_Incident_Beam_Thick_Sample_Absorption ===== ===== Fixed_Incident_Beam_Thick_Sample_Absorption =====
  
-Thick Sample absorption correction for fixed incident beam geometry. There is a typo in the delta function in the original reference. It's correct here.+Thick Sample absorption correction for fixed incident beam geometry. There is a typo in the delta function in the original reference. It's correct here.\\ 
 Ref: Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546. Ref: Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546.
 <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Absorption { FIBTSA } <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Absorption { FIBTSA }

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