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fixed_incident_beam [2010/10/19 00:19]
rowlesmr fixed line breaks
fixed_incident_beam [2010/10/19 00:31]
rowlesmr added links to papers
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 This is a collection of macros that are used to model the effects of a flat plat sample with a fixed angle incident beam.  This is a collection of macros that are used to model the effects of a flat plat sample with a fixed angle incident beam. 
  
-There is a nice overview of their application in [1]. Individual references are given for each macro.+There is a (niceoverview of their application in [1]. Individual references are given for each macro.
  
 Contributor:​ Matthew Rowles Contributor:​ Matthew Rowles
  
  
-[1] Rowles, M. R. & Madsen, I. C. 2010, '​Whole-Pattern Profile Fitting of Powder Diffraction Data Collected in Parallel-Beam Flat-Plate Asymmetric Reflection Geometry',​ Journal of Applied Crystallography,​ vol. 43, no. 3, pp. 632-634.+[1] [[http://​dx.doi.org/​10.1107/​S0021889810007673|Rowles, M. R. & Madsen, I. C. 2010, '​Whole-Pattern Profile Fitting of Powder Diffraction Data Collected in Parallel-Beam Flat-Plate Asymmetric Reflection Geometry',​ Journal of Applied Crystallography,​ vol. 43, no. 3, pp. 632-634]].
  
  
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 Scales the intensity for a thick sample in fixed incident beam geometry Scales the intensity for a thick sample in fixed incident beam geometry
 Must be used in conjunction with Fixed_Incident_Beam_Peak_Position_Correction if you want to model sample displacement. This macro doesn'​t take into account the effect of any diffracted beam optics. As it stands, it is directly applicable to large curved PSDs, eg the Inel CPS120. Any slits, crystals etc in the diffracted beam would limit the detected intensity. The original paper discusses this.\\ ​ Must be used in conjunction with Fixed_Incident_Beam_Peak_Position_Correction if you want to model sample displacement. This macro doesn'​t take into account the effect of any diffracted beam optics. As it stands, it is directly applicable to large curved PSDs, eg the Inel CPS120. Any slits, crystals etc in the diffracted beam would limit the detected intensity. The original paper discusses this.\\ ​
-Ref: Toraya, H., Huang, T. C. & Wu, Y. (1993). J. Appl. Cryst. 26, 774-777.+Ref: [[http://​dx.doi.org/​10.1107/​S0021889893004881|Toraya, H., Huang, T. C. & Wu, Y. (1993). J. Appl. Cryst. 26, 774-777]].
 <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Intensity_Correction (alpha, alpha_v) <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Intensity_Correction (alpha, alpha_v)
 { {
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 Models sample displacement as required for a flat plate in fixed incident beam geometry. Valid for both thick and thin samples.\\ ​ Models sample displacement as required for a flat plate in fixed incident beam geometry. Valid for both thick and thin samples.\\ ​
-Ref: Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546.+Ref: [[http://​dx.doi.org/​10.1107/​S0021889896004839|Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546]].
 <code topas>​macro Fixed_Incident_Beam_Peak_Position_Correction (alpha, alpha_v, sd, sd_v) <code topas>​macro Fixed_Incident_Beam_Peak_Position_Correction (alpha, alpha_v, sd, sd_v)
 { {
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 A macro that corrects the peak profile for a flat plate in fixed incident beam geometry, assuming a parallel incident beam and no diffracted optics. Theoretically,​ the mixing parameter should be "​1"​ for an incident beam intensity profile of a hat, but realistically,​ there will be some tapering of intensity at the edges, hence the gaussian... This should be used in conjunction with [[fixed_incident_beam#​Fixed_Incident_Beam_Thick_Sample_Correction]].\\ ​ A macro that corrects the peak profile for a flat plate in fixed incident beam geometry, assuming a parallel incident beam and no diffracted optics. Theoretically,​ the mixing parameter should be "​1"​ for an incident beam intensity profile of a hat, but realistically,​ there will be some tapering of intensity at the edges, hence the gaussian... This should be used in conjunction with [[fixed_incident_beam#​Fixed_Incident_Beam_Thick_Sample_Correction]].\\ ​
-Ref: Rowles, M. R. & Madsen, I. C. (2010). J. Appl. Cryst. 43, 632-634.+Ref: [[http://​dx.doi.org/​10.1107/​S0021889810007673|Rowles, M. R. & Madsen, I. C. (2010). J. Appl. Cryst. 43, 632-634]].
 <code topas>​macro Fixed_Incident_Beam_Footprint_Correction_With_Mixing { FIBFCWM } <code topas>​macro Fixed_Incident_Beam_Footprint_Correction_With_Mixing { FIBFCWM }
 macro FIBFCWM(alpha_v,​ beam_v, mix_v) { FIBFCWM(, alpha_v,, beam_v,,​mix_v) } macro FIBFCWM(alpha_v,​ beam_v, mix_v) { FIBFCWM(, alpha_v,, beam_v,,​mix_v) }
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 Thick Sample absorption correction for fixed incident beam geometry. There is a typo in the delta function in the original reference. It's correct here.\\ ​ Thick Sample absorption correction for fixed incident beam geometry. There is a typo in the delta function in the original reference. It's correct here.\\ ​
-Ref: Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546.+Ref: [[http://​dx.doi.org/​10.1107/​S0021889896004839|Masson, O., Guiebretière,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546]].
 <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Absorption { FIBTSA } <code topas>​macro Fixed_Incident_Beam_Thick_Sample_Absorption { FIBTSA }
 macro FIBTSA(alpha_v,​ mu_v) { FIBTSA(,​alpha_v,,​mu_v) } macro FIBTSA(alpha_v,​ mu_v) { FIBTSA(,​alpha_v,,​mu_v) }

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