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fixed_incident_beam_absorption [2010/10/19 00:04]
rowlesmr
fixed_incident_beam_absorption [2020/07/16 11:29]
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-====== Fixed_Incident_Beam_Thick_Sample_Absorption ====== 
- 
-This macro is part of a collection of macros that are used to model the effects of a flat plat sample with a fixed angle incident beam. 
- 
-There is a nice overview of their application in [1]. Individual references are given for each macro. 
- 
-[1] Rowles, M. R. & Madsen, I. C. 2010, '​Whole-Pattern Profile Fitting of Powder Diffraction Data Collected in Parallel-Beam Flat-Plate Asymmetric Reflection Geometry',​ Journal of Applied Crystallography,​ vol. 43, no. 3, pp. 632-634. 
- 
-Contributor:​ Matthew Rowles 
- 
- 
-Thick Sample absorption correction for fixed incident beam geometry. There is a typo in the delta function in the original reference. It's correct here.\\ ​ 
-Ref: Masson, O., Guiebreti√®re,​ R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546. 
-<code topas>​macro Fixed_Incident_Beam_Thick_Sample_Absorption { FIBTSA } 
-macro FIBTSA(alpha_v,​ mu_v) { FIBTSA(,​alpha_v,,​mu_v) } 
-macro FIBTSA(alpha,​ alpha_v, mu, mu_v) 
-{   ​ 
-   #​m_argu mu    ''​in cm^-1 
-   #​m_argu alpha ''​in degrees 
-   ​If_Prm_Eqn_Rpt(mu,​ mu_v, min 3 max 500) 
-   ​If_Prm_Eqn_Rpt(alpha,​ alpha_v, min 0.0001 max 90) 
-   ​exp_conv_const = Ln(0.001) (1/​((CeV(mu,​mu_v) Rs / 10) ((1/Tan(2 Th - CeV(alpha,​alpha_v) Deg)) + Tan(Th)))) Rad; 
-                  ''​^ the Ln(0.001) is because of the definition of the exp func in topas -- see the manual. 
-                                                 ''​^ the /10 is in there because Rs is in mm and mu is in cm^-1 
-}</​code>​ 
  

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