Trace: • inel_flat_plate_v2

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macro Inel_Flat_Plate_V2(alpha, alpha_v, sd, sd_v) ' Version by Matthew Rowles CSIRO Minerals ' Equations for correction of intensity and sample displacement for flat plate samples ' in fixed incident beam geometry e.g. when using the Inel CPS120 position sensitive detector ' Intensity correction derived from Toraya et al. (1993) ' Sample displacement model derived by Ian Madsen ' alpha = angle between incident beam and sample surface ' 2Theta = (alpha + beta) ' where beta = angle between diffracted beam(s) and sample surface ' sd = sample displacement (in same units as detector radius) ' Rs = 250mm for the Inel CPS120 detector { #m_argu alpha ' alpha = angle between incident beam and sample surface #m_argu sd ' sd = displacement of the sample (in same units as detector radius) If_Prm_Eqn_Rpt(alpha, alpha_v, min 0.0001 max 90) If_Prm_Eqn_Rpt(sd, sd_v, min -1 max 1) scale_pks = IF (2 Th) < CeV(alpha, alpha_v) Deg THEN 0 ELSE 2 / (1 + (Sin(CeV(alpha, alpha_v) Deg) / Sin(2 Th - CeV(alpha, alpha_v) Deg))) ENDIF; th2_offset = IF CeV(sd, sd_v) == 0 THEN 0 ELSE - Rad (CeV(sd, sd_v) Sin(2 Th)) / (Rs Sin(CeV(alpha, alpha_v) Deg)) ENDIF; }