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inel_flat_plate_v2 [2009/09/25 05:41]
ianmadsen created
inel_flat_plate_v2 [2009/09/25 06:29]
ianmadsen
Line 6: Line 6:
  ' Intensity correction derived from Toraya et al. (1993)  ' Intensity correction derived from Toraya et al. (1993)
  ' Sample displacement model derived by Ian Madsen  ' Sample displacement model derived by Ian Madsen
- ' ​  alpha = angle between incident beam and sample surface + ' 2Theta = (alpha + beta) 
- ' ​  2Theta = (alpha + beta) + ' ​  ​where beta  = angle between diffracted beam(s) and sample surface 
- ' ​     where beta  = angle between diffracted beam(s) and sample surface + ' Rs = 250mm for the Inel CPS120 detector ​- Rs must be defined in the input file
- ' ​  sd = sample displacement (in same units as detector radius) +
- ' ​  Rs = 250mm for the Inel CPS120 detector+
 { {
    #​m_argu alpha    ' alpha = angle between incident beam and sample surface    #​m_argu alpha    ' alpha = angle between incident beam and sample surface

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